Browsing by Subject "Scanning electron microscopy"
Now showing items 1-2 of 2
-
(2019-11-08)The original Moore’s law has slowed down. It has become unfeasible to double the number of transistor per unit area on integrated circuits every 18 to 24 months. However, the continuous need for computation power is driving ...
-
(Texas A&M University, 2006-04-12)Fatigue crack growth in ±-Zirconium phosphate/epoxy nanocomposites was investigated. A new fatigue testing technique was implemented for miniature samples. Two different methods strength of materials and Rayleigh-Ritz - ...